Secondary electron spectroscopy in a dedicated scanning transmission electron microscope
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Secondary electron imaging as an aid to STEM microanalysis
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5. Classical Electrodynamics;Jackson,1975
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1. Secondary electron coincidence detection and time of flight spectroscopy;Ultramicroscopy;1993-12
2. Secondary-electron emission from magnesium oxide;Philosophical Magazine Letters;1993-09
3. Observation of the Ag/Si(111) system using a high-resolution ultra-high vacuum scanning electron microscope;Surface Science;1993-08
4. Electron reflection, diffraction and imaging of bulk crystal surfaces in TEM and STEM;Reports on Progress in Physics;1993-08-01
5. Effect of specimen bias on secondary electron images in the STEM;Ultramicroscopy;1992-08
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