A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM400
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Scanning tunneling microscopy
2. for a review, see Scanning Tunneling Microscopy '87 (J. Vacuum Sci. Technol., in press).
3. S.L. Lindsay and B. Barris, J. Vacuum. Sci. Technol., in press.
4. Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfaces
5. The image contrast of surface steps in reflection electron microscopy
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