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A platform forin-situmulti-probe electronic measurements and modification of nanodevices inside a transmission electron microscope

  • Published:2014-05-15 Issue:22 Volume:25 Page:225702
  • ISSN:0957-4484
  • Container-title:Nanotechnology
  • language:
  • Short-container-title:Nanotechnology

Author:

Xu T T,Ning Z Y,Shi T W,Fu M Q,Wang J Y,Chen Q

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Perspective and prospects of in situ transmission/scanning transmission electron microscopy;Microscopy;2023-11-25

2. Designing Liquid and Gas Cell Holders;In‐Situ Transmission Electron Microscopy Experiments;2023-05-12

3. In‐SituTEM;In‐Situ Transmission Electron Microscopy Experiments;2023-05-12

4. In situ transmission electron microscope studies on one-dimensional nanomaterials: Manipulation, properties and applications;Progress in Materials Science;2020-08

5. Ceramic nanowelding;Nature Communications;2018-01-08
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