A comparison of ZAF-correction methods in quantitative X-ray microanalysis of light-element specimens
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Electron-probe microanalysis: The relation between intensity ratio and concentration
2. Electron Microprobe Analysis;Reed,1975
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