Author:
Foitzik A.H.,Xiao S.-Q.,Heuer A.H.,Wunderlich W.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. On a high-purity Ge EDS detector I. Determination of detector efficiency
2. On a high-purity Ge EDS detector II. Ice layer formation and optimization of detector design
3. Practical Analytical Electron Microscopy in Materials Science;Williams,1984
4. SEM 1977;Goldstein,1977
5. Advances in Analysis of Microstructural Features by Electron Beam Techniques;Bishop,1974
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