On a high-purity Ge EDS detector II. Ice layer formation and optimization of detector design-Reference-Cited by-同舟云学术

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On a high-purity Ge EDS detector II. Ice layer formation and optimization of detector design

Published:1993-07 Issue:2 Volume:50 Page:219-227
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Foitzik A.H.,Sears J.S.,Xiao S.-Q.,Heuer A.H.,Wunderlich W.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. On a high-purity Ge EDS detector I. Determination of detector efficiency

2. Practical Analytical Electron Microscopy in Materials Science;Williams,1984

3. On the quantitative EDS analysis of low carbon concentrations in analytical TEM

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods;Journal of Microscopy;2006-02

2. On a high-purity Ge EDS detector III. The reliable acquisition of EDS spectra;Ultramicroscopy;1993-07

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