Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Electron holography approaching atomic resolution
2. Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
3. Performance of electron image converters with YAG single-crystal screen and CCD sensor
4. Methods to measure properties of slow‐scan CCD cameras for electron detection
5. Analysis of electron image detection efficiency of slow-scan CCD cameras
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