A new method for optimal-resolution electron microscopy of radiation-sensitive specimens-Reference-Cited by-同舟云学术

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A new method for optimal-resolution electron microscopy of radiation-sensitive specimens

Published:1980-01 Issue:1-3 Volume:5 Page:459-468
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Fujiyoshi Y.,Kobayashi T.,Ishizuka K.,Uyeda N.,Ishida Y.,Harada Y.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Electron microscopy of tobacco mosaic virus under conditions of minimal beam exposure

2. Molecular structure determination by electron microscopy of unstained crystalline specimens

3. Minimal beam exposure with a field emission source

4. Proc. 6th European Congr. on Electron Micrscopy;Herrmann,1976

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