Progress in environmental high-voltage transmission electron microscopy for nanomaterials

Author:

Tanaka Nobuo12ORCID,Fujita Takeshi3,Takahashi Yoshimasa4,Yamasaki Jun15,Murata Kazuyoshi6,Arai Shigeo12

Affiliation:

1. Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Nagoya 464-8603, Japan

2. Nano-structure Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan

3. School of Environmental Science and Engineering, Kochi University of Technology, Kochi 782-8502, Japan

4. Department of Mechanical Engineering, Kansai University, Suita 564-8680, Japan

5. Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki 567-0047, Japan

6. National Institute for Physiological Sciences, Okazaki 444-8585, Japan

Abstract

A new environmental high-voltage transmission electron microscope (E-HVEM) was developed by Nagoya University in collaboration with JEOL Ltd. An open-type environmental cell was employed to enable in-situ observations of chemical reactions on catalyst particles as well as mechanical deformation in gaseous conditions. One of the reasons for success was the application of high-voltage transmission electron microscopy to environmental (in-situ) observations in the gas atmosphere because of high transmission of electrons through gas layers and thick samples. Knock-on damages to samples by high-energy electrons were carefully considered. In this paper, we describe the detailed design of the E-HVEM, recent developments and various applications. This article is part of a discussion meeting issue ‘Dynamic in situ microscopy relating structure and function'.

Publisher

The Royal Society

Subject

General Physics and Astronomy,General Engineering,General Mathematics

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