High-resolution shadow image superimposed on LACBED patterns: a method demonstrated on GexSi1−x/Si superlattice
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Comparison of strain field in cleaved XSTM specimen with un-cleaved InAs/GaAs quantum dot nanostructure;Surface Science;2004-08
2. Structural roughness and interface strain properties in Si/SiO2/poly-Si1-xGex tri-layer system with ultrathin oxide;Journal of Materials Science: Materials in Electronics;2003
3. AFM, SEM, EDX and HRTEM study of the crystalline growth rate anisotropy-induced internal stress and surface roughness of YBaCuO thin film;Materials Characterization;2001-01
4. Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern;Materials Science and Engineering: A;2000-09
5. Stress relaxation in c ⊥ – c // YBaCuO thin films on MgO substrate studied by LACBED;Thin Solid Films;2000-06
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