A simple spot-size versus pixel-size criterion for X-ray microanalysis of thin foils-Reference-Cited by-同舟云学术

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A simple spot-size versus pixel-size criterion for X-ray microanalysis of thin foils

Published:1992-04 Issue:1-3 Volume:41 Page:193-199
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Van Cappellen Eric,Schmitz Albrecht

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Principles of Analytic Electron Microscopy;Goldstein,1986-1989

2. SEM/77;Goldstein,1977

3. SEM/77;Goldstein,1977

4. Quantitative Microanalysis with High Spatial Resolution;Doig,1981

5. Spatial resolution in x-ray microanalysis of thin foils in stem

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