Chemical lattice imaging: a pedantic note
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Quantitative Analysis of High-Resolution Atomic Images;Progress in Transmission Electron Microscopy 1;2001
2. Real-space analysis of lattice images and its link to conventional theory;Ultramicroscopy;1997-07
3. Strain relaxation of Si/Ge multilayers: Coherent islands formation and their evolution as a function of the strain;Journal of Applied Physics;1996-02
4. Strain Relaxation of Si/Ge Multilayers Investigated by Transmission Electron Microscopy and High-Resolution X-Ray Diffractometry;Microscopy Microanalysis Microstructures;1995
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