Simultaneous determination of sample thickness, tilt, and electron mean free path using tomographic tilt images based on Beer–Lambert law-Reference-Cited by-同舟云学术

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Simultaneous determination of sample thickness, tilt, and electron mean free path using tomographic tilt images based on Beer–Lambert law

Published:2015-11 Issue:2 Volume:192 Page:287-296
ISSN:1047-8477
Container-title:Journal of Structural Biology
language:en
Short-container-title:Journal of Structural Biology

Author:

Yan Rui,Edwards Thomas J.,Pankratz Logan M.,Kuhn Richard J.,Lanman Jason K.,Liu Jun,Jiang Wen

Funder

National Institute of Allergy and Infectious Diseases

Welch Foundation

Publisher

Elsevier BV

Subject

Structural Biology

Reference34 articles.

1. Cryo-electron microscopy of viruses;Adrian;Nature,1984

2. Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beam;Boergens;J. Microsc.,2013

3. Cryo automated electron tomography: towards high-resolution reconstructions of plastic-embedded structures;Braunfeld;J. Microsc.,1994

4. Does contamination buildup limit throughput for automated cryoEM?;Cheng;J. Struct. Biol.,2006

5. Measurement of ice thickness on vitreous ice embedded cryo-EM grids: investigation of optimizing condition for visualizing macromolecules;Cho;J. Anal. Sci. Technol.,2013

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