Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beam-Reference-Cited by-同舟云学术

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Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beam

Published:2013-09-24 Issue:3 Volume:252 Page:258-262
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

BOERGENS K. M.¹,DENK W.¹

Affiliation:

1. Max Planck Institute for Medical Research; Jahnstr. 29 69120 Heidelberg Germany

Funder

Max Planck Society

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12086/fullpdf

Reference9 articles.

1. Volume electron microscopy for neuronal circuit reconstruction;Briggman;Curr. Opin. Neurobiol.,2012

2. Towards neural circuit reconstruction with volume electron microscopy techniques;Briggman;Curr. Opin. Neurobiol.,2006

3. Wiring specificity in the direction-selectivity circuit of the retina;Briggman;Nature,2011

4. Structural neurobiology: missing link to a mechanistic understanding of neural computation. Nature reviews;Denk;Neuroscience,2012

5. Serial block-face scanning electron microscopy to reconstruct three-dimensional tissue nanostructure;Denk;PLoS Biol.,2004

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2. Microscopic Visualization of Cell-Cell Adhesion Complexes at Micro and Nanoscale;Frontiers in Cell and Developmental Biology;2022-04-20

3. From Light Microscopy to Analytical Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)/SEM in Biology: Fixed Coordinates, Flat Embedding, Absolute References;Microscopy and Microanalysis;2018-09-24

4. Volume Scanning Electron Microscopy: Serial Block-Face Scanning Electron Microscopy Focussed Ion Beam Scanning Electron Microscopy;Biological and Medical Physics, Biomedical Engineering;2017-12-31

5. Enhanced FIB-SEM systems for large-volume 3D imaging;eLife;2017-05-13

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