1. Muchaidze G, Koo J, Cai Q, Li T, Han L J, Martwick A, Wang K, Min J, Drewniak J L, Pommerenke D. Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge problems. IEEE Transactions on Electromagnetic Compatibility, 2008, 50, 268–276.
2. Perumalraj R, Dasaradan B S. Electromagnetic shielding effectiveness of copper core yarn knitted fabrics. Indian Journal of Fibre & Textile Research, 2009, 34, 149–154.
3. Yeh C T, Ker M D. Study of intrinsic characteristics of ESD protection diodes for high-speed I/O applications. Microelectronics Reliability, 2012, 52, 1020–1030.
4. Pommerenke D, Koo J, Muchaidze G. Finding the root cause of an ESD upset event. Proceedings of the 2006 DesignCon, Santa Clara, USA, 2006, 12–36.
5. Han L J, Koo J. Pommerenke D, Beetner D, Carlton R. Experiment investigation of the ESD sensitivity of an 8-Bit microcontroller. Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, Hawaii, USA, 2007, 1–6.