Spectroscopic Infrared Ellipsometry
Author:
Publisher
Elsevier
Reference40 articles.
1. XXVI. Optical constants of metals in the infra-red—experimental methods
2. Fast polarization modulated ellipsometer using a microprocessor system for digital Fourier analysis
3. Analysis of a Polarizing Michelson Interferometer for Dual Beam Fourier Transform Infrared, Circular Dichroism Infrared, and Reflectance Ellipsometric Infrared Spectroscopies
4. Spectroscopic ellipsometry in the infrared
5. Infrared Spectroscopic Ellipsometry;Röseler,1990
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