Formation and diffusion properties of oxide films on metals and on nitride coatings studied with Auger electron spectroscopy and X-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

Formation and diffusion properties of oxide films on metals and on nitride coatings studied with Auger electron spectroscopy and X-ray photoelectron spectroscopy

Published:1990-12 Issue: Volume:193-194 Page:648-664
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Hofmann S

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference70 articles.

1. Low Temperature Oxidation;Fehlner,1986

2. The oxidation of metals

3. High Temperature Corrosion;Kofstad,1988

4. Surface and Near-Surface Chemistry of Oxide Materials;Hirschwald,1988

5. A comparative study of methods for thin-film and surface analysis

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