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Spectroscopic ellipsometry study of the relaxation state of amorphous silicon

  • Published:1993-10 Issue:1-2 Volume:233 Page:203-206
  • ISSN:0040-6090
  • Container-title:Thin Solid Films
  • language:en
  • Short-container-title:Thin Solid Films

Author:

Reitano R.,Grimaldi M.G.,Baeri P.,Borghesi A.,Sassella A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applicability of an economic diode laser emitting at 980 nm for preparation of polycrystalline silicon thin film solar cells on glass;physica status solidi (a);2017-07-18

2. Investigations on Microcrystalline Silicon Films for Solar Cell Application;Bulletin of the Korean Chemical Society;2010-10-20

3. Amorphous silicon waveguides for microphotonics;Journal of Applied Physics;2002-07-15

4. Optical evidence of amorphous-network change in the initial-growth stage a-Si:H;Journal of Non-Crystalline Solids;2000-09

5. Spectroscopic ellipsometry applied to the determination of an ion implantation depth profile;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-05
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