Complete optical analysis of a non-absorbing thin film on an absorbing substrate by a new method of immersion spectroscopic reflectometry
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. VI Methods for Determining Optical Parameters of Thin Films
2. Measurement and Production of Thin Films in Optics;Vašíček,1957
3. Effect of Dispersion on the Reflection and Transmission Extrema from a Monolayer
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2. Method of the ratio of envelopes of the reflection spectrum for measuring optical constants and thickness of thin films;Optics and Spectroscopy;2000-04
3. Comparison of optical and nonoptical methods for measuring surface roughness;11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics;1999-07-14
4. New technique of measurement of optical parameters of thin films;Thin Solid Films;1996-06
5. Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries;Optical Engineering;1995-06-01
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