Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries
Author:
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Cited by 30 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies;Optics Express;2022-10-07
2. Optical characterization of inhomogeneous thin films with randomly rough boundaries;Optics Express;2022-01-07
3. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy;Journal of Optics;2021-09-07
4. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization;Coatings;2020-12-27
5. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry;Applied Surface Science;2020-12
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