Author:
Palik E.D.,Holm R.T.,Gibson J.W.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. Optical constants of thin films;Rouard;Prog. Opt.,1965
2. Methods for determining optical properties of thin films;Abèles;Prog. Opt.,1963
3. Precision measurements in thin film optics;Bennett;Phys. Thin Films,1967
4. Ellipsometry and its applications to surface examination
5. Interference Method for Measuring the Thickness of Epitaxially Grown Films
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献