Ellipsometry and its applications to surface examination
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/6/i=5/a=001/pdf
Reference112 articles.
1. Tribo-Ellipsometry: A New Technique to Study the Relationship of Repassivation Kinetics to Stress Corrosion
2. Determination of the Properties of Films on Silicon by the Method of Ellipsometry
3. Measurement of oxygen adsorption on silicon by ellipsometry
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