Transmission electron microscopy studies of the polycrystalline silicon-SiO2 interface
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Influence of crystal structure on the luminescence of ions with s2 configuration
2. Structure and Stability of Low Pressure Chemically Vapor‐Deposited Silicon Films
3. Phosphorus Doping of Low Pressure Chemically Vapor‐Deposited Silicon Films
4. Thermal Oxidation of Phosphorus‐Doped Polycrystalline Silicon in Wet Oxygen
5. Grain Growth Mechanism of Heavily Phosphorus‐Implanted Polycrystalline Silicon
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