Information about the microcrystalline structure from the IR reflection spectra of thin UV optical films: NdF3 and MgF2
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Vacuum ultraviolet thin films 1: Optical constants of BaF_2, CaF_2, LaF_3, MgF_2, Al_2O_3, HfO_2, and SiO_2 thin films
2. Summary Abstract: Ion‐assisted optical thin film deposition
3. Coatings and Glass;Pulker,1985
4. Refractive index and packing density for MgF2 films: Correlation of temperature dependence with water sorption
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1. Study of structure and antireflective properties of LaF3/HfO2/SiO2 and LaF3/HfO2/MgF2 trilayers for UV applications;Optical Materials;2015-01
2. Evaporation and Condensation of SiO and SiO2 Studied by Infrared Spectroscopy;Applied Spectroscopy;2010-03
3. IR spectroscopy of adsorbates on ultrathin metal films;physica status solidi (b);2005-11
4. Spectrophotometric determination of absorption in the DUV/VUV spectral range for MgF 2 and LaF 3 thin films;SPIE Proceedings;2000-11-02
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