Investigation of ring structures for metal-semiconductor contact resistance determination-Reference-Cited by-同舟云学术

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Investigation of ring structures for metal-semiconductor contact resistance determination

Published:1987-01 Issue:1 Volume:146 Page:15-20
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Willis A.J.,Botha A.P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Integrated Circuits;Warner,1965

2. An exact derivation of contact resistance to planar devices

3. Ohmic contacts for GaAs devices

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