Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
25 articles.
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1. Electromigration in ULSI interconnects;Materials Science and Engineering: R: Reports;2007-10
2. Electromigration;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27
3. Electromigration: A review;Microelectronics Reliability;1997-07
4. 30 Years of Electromigration Research: A Grand Masters' Perspective;MRS Proceedings;1996
5. VLSI reliability challenges: From device physics to wafer scale systems;Microelectronics Reliability;1995-03