Preparation and characterization studies of submicropores in MnO2 semiconductor films-Reference-Cited by-同舟云学术

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Preparation and characterization studies of submicropores in MnO2 semiconductor films

Published:1991-06 Issue:1 Volume:201 Page:L7-L8
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Bayrachny B.,Cheremskoy P.,Gomozov V.,Murovzev L.,Skatkov L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference1 articles.

1. Small-angle scattering X-rays;Guinier,1990

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of porosity and fractal properties of the sintered metal and semiconductor layers in the MDS capacitor structure;Science of Sintering;2012

2. SAXS Investigation of the Sintered Niobium Powder: Method of Stabilizing Porosity and Fractal Properties;Ceramic Transactions Series;2010-02-23

3. Fabrication and Characterization of Multilayer Ultrathin Films of Exfoliated MnO2 Nanosheets and Polycations;Chemistry of Materials;2003-06-13

4. Pore structure of sintered niobium after reaction with hydrogen and nitrogen;Powder Metallurgy;2000-02

5. Thin Films of Octahedral Molecular Sieves of Manganese Oxide;Chemistry of Materials;1997-01-01

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