Investigation of porosity and fractal properties of the sintered metal and semiconductor layers in the MDS capacitor structure
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Published:2012
Issue:1
Volume:44
Page:95-101
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ISSN:0350-820X
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Container-title:Science of Sintering
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language:en
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Short-container-title:SCI SINTER
Author:
Skatkov Leonid1,
Gomozov Valeriy2,
Bayrachniy Boris2
Affiliation:
1. PCB "Argo", Beer Sheva, Israel
2. NTU "KhPI", Kharkov, Ukraine
Abstract
MDS capacitor (metal - dielectric - semiconductor) is a structure in which
metal plate is represented by compact bulk-porous pellets of niobium sintered
powder, and semiconductor plate - by pyrolytic layer of MnO2. In the present
paper we report the results of investigation of microporosity of sintered Nb
and pyrolytic MnO2 and also the fractal properties of semiconductor layer.
Publisher
National Library of Serbia
Subject
Materials Chemistry,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites