Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
64 articles.
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1. Interdiffusion in Pd/Ti Bilayer Films Studied by Auger Electron Depth Profiling;Japanese Journal of Applied Physics;1993-09-15
2. Structural investigations of evaporated GeSe films;Thin Solid Films;1990-09
3. References;Thin Films by Chemical Vapour Deposition;1990
4. Structure of β-Nb2N and γ-Ta2N heteroepitaxial layers grown on multi-oriented films on Nb and Ta deposited on copper substrates;Journal of Crystal Growth;1988-01
5. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986