Author:
Urban Frank K.,Park Dong C.,Tabet Milad F.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Ellipsometry and Polarized Light;Azzam,1977
2. Ellipsometer measurement of thickness and optical properties of thin absorbing films
3. Numerical Recipes, The Art of Scientific Computing (Fortran Version);Press,1989
Cited by
26 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献