Ellipsometer measurement of thickness and optical properties of thin absorbing films-Reference-Cited by-同舟云学术

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Ellipsometer measurement of thickness and optical properties of thin absorbing films

Published:1988-09 Issue: Volume:33-34 Page:934-941
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Urban Frank K.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference11 articles.

1. Ellipsometry and Polarized Light;AzzaM,1977

2. Spectroscopic Ellipsometry of Solids;Aspnes,1976

3. Optics of Thin Films;Vasicek,1960

4. Ellipsometry in the Measurement of Surfaces and Films,1964

5. Optical Studies of Metal Surfaces;Winterbottom;Kgl. Norske Videnskab. Selskabs, Skrifter,1955

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Spectroscopic ellipsometer study of laser ablation wavelength dependent growth kinetics of Ag nanoislands: An insight to potential plasmonic applications;Applied Surface Science;2018-07

2. 2 Passive Oxide Films on Iron by In-Situ Detection of Optical Techniques;Modern Aspects of Electrochemistry;2011-12-29

3. Relationships among Resonant Frequency Changes on a Coated Quartz Crystal Microbalance, Thickness Changes, and Resistance Responses of Polymer−Carbon Black Composite Chemiresistors;Analytical Chemistry;2000-04-01

4. Molecular beam epitaxy cell optimized for organic compounds and preparation of a Cu phthalocyanine thin film;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1994-09

5. Ellipsometry algorithm for absorbing films;Applied Optics;1993-05-01

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