Accurate determination of optical constants of absorbing materials: measurements of transmittance and reflectance of thin films on partially metallized substrates-Reference-Cited by-同舟云学术

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Accurate determination of optical constants of absorbing materials: measurements of transmittance and reflectance of thin films on partially metallized substrates

Published:1980-06 Issue:2 Volume:69 Page:L15-L17
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Hjortsberg A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Optical Properties of Thin Solid Films;Heavens,1950

2. A. Hjortsberg and C. G. Granqvist, Appl. Opt., to be published.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ellipsometry of coelostat coatings using a Babinet compensator: Simulation of the experimental accuracy;Solar Physics;1996-08

2. Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry;Applied Optics;1990-02-01

3. Determination of the optical constants of evaporated dye layers;Thin Solid Films;1989-03

4. Ellipsometric analysis of thin NiCr films;Thin Solid Films;1989-02

5. Ion-Beam Processing of Optical Thin Films;Physics of Thin Films - Advances in Research and Development;1987

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