Optical analysis of absorbing double layers by combined reflection and transmission ellipsometry
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. The investigation of double layers in semiconductor technology
2. Optical analysis of non-absorbing double layers by means of immersion reflectometry I: Liquid immersion method
3. Optical analysis of non-absorbing double layers by means of immersion reflectometry II: Solid state immersion method
4. Ellipsometric study of a thin transparent film overlaid on a transparent substrate having a surface layer
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1. Simulated annealing–simplex hybrid algorithm for ellipsometric data inversion of multilayer films;Review of Scientific Instruments;2013-06
2. Ellipsometry of Thin Film Systems;Progress in Optics;2000
3. The Basic Optical Properties, Optical Constants and Optical Conductivity of Bismuth Single Thin Films and Bismuth–Copper Bilayer Systems;physica status solidi (a);1998-08
4. Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry;Applied Optics;1990-02-01
5. Ellipsometric analysis of thin NiCr films;Thin Solid Films;1989-02
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