Author:
Parikh N.R.,Sandhu G.S.,Yu N.,Chu W.K.,Jackman T.E.,Baribeau J.-M.,Houghton D.C.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
9 articles.
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1. Surface and Thin-Film Analysis, 3. Ion Detection;Ullmann's Encyclopedia of Industrial Chemistry;2011-10-15
2. Rutherford Backscattering Spectroscopy (RBS);Surface and Thin Film Analysis;2011-04-12
3. Surface and Thin-Film Analysis;Ullmann's Encyclopedia of Industrial Chemistry;2002-01-15
4. Heavy ion RBS analysis of strained layer superlattices;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-05
5. Quantitative Rutherford Backscattering from Thin Films;MRS Bulletin;1993-01