High precision UV-visible-near-IR Stokes vector spectroscopy-Reference-Cited by-同舟云学术

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High precision UV-visible-near-IR Stokes vector spectroscopy

Published:1993-10 Issue:1-2 Volume:234 Page:402-407
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Zettler J.-Th.,Trepk Th.,Spanos L.,Hu Y.-Z.,Richter W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Principles of Optics;Born,1980

2. Infrared Spectroscopic Ellipsometry;Röseler,1990

3. Sensitivity of Optical Measurements on Planar Stratified Structures;Humlíček,1990

4. Ellipsometry and Polarized Light;Azzam,1977

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1. Optimization of the dielectric-function modeling by B-splines in spectroscopic ellipsometry analysis: A hybrid approach;Thin Solid Films;2022-11

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3. Spectroscopic ellipsometry data analysis using penalized splines representation for the dielectric function;Thin Solid Films;2019-01

4. Spectroscopic ellipsometric investigation of graphene and thin carbon films from the point of view of depolarization effects;Applied Surface Science;2017-11

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