Spectroscopic ellipsometry data analysis using penalized splines representation for the dielectric function-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry data analysis using penalized splines representation for the dielectric function

Published:2019-01 Issue: Volume:669 Page:174-180
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Likhachev D.V.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. Spectroscopic Ellipsometry and Reflectometry: A User's Guide;Tompkins,1999

2. Spectroscopic Ellipsometry: Principles and Applications;Fujiwara,2007

3. Optical physics of materials;Collins,2005

4. Data analysis for nanomaterials: Effective medium approximation, its limits and implementations;Humlicek,2013

5. Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization;Tompkins,2016

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1. Dielectric function and interband critical points of compressively strained ferroelectric K_0.85Na_0.15NbO₃ thin film with monoclinic and orthorhombic symmetry;Optics Express;2024-04-12

2. Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach;Journal of Applied Spectroscopy;2023-11

3. Evaluation of optical constants in oxide thin films using machine learning;Japanese Journal of Applied Physics;2023-08-01

4. Certain topics in ellipsometric data modeling with splines: a review of recent developments;Advanced Optical Technologies;2022-07-04

5. On the optimization of knot allocation for B-spline parameterization of the dielectric function in spectroscopic ellipsometry data analysis;Journal of Applied Physics;2021-01-21

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