Improved rotating analyser-polarizer type of scanning ellipsometer-Reference-Cited by-同舟云学术

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Improved rotating analyser-polarizer type of scanning ellipsometer

Published:1993-10 Issue:1-2 Volume:234 Page:385-389
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Chen Liang-Yao,Feng Xing-Wei,Su Yi,Ma Hong-Zhou,Qian You-Hua

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Optical Properties of Solids—New Developments;Aspnes,1976

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Method for Analyzing the Measurement Error with Respect to Azimuth and Incident Angle for the Rotating Polarizer Analyzer Ellipsometer;Crystals;2021-03-29

2. Spectroscopic ellipsometry and its applications in the study of thin film materials;Chinese Optics;2019

3. Rotating polarizer analyzer ellipsometer with a fixed compensator;Optik - International Journal for Light and Electron Optics;2013-09

4. Noise Effect on Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer;Acta Physica Polonica A;2012-07

5. Development and construction of rotating polarizer analyzer ellipsometer;Optics and Lasers in Engineering;2011-04

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