Multiple internal reflection spectroscopy for quantitative infrared analysis of thin-film surface coating for biological environment
Author:
Publisher
Elsevier BV
Subject
Biomaterials,Bioengineering,Mechanics of Materials
Reference8 articles.
1. Microarrays and Microchips Japan, June 4th;Vinet,2001
2. Internal Reflection Spectroscopy;Harrick,1967
3. Multiple internal reflection spectroscopy: a sensitive non-destructive probe for interfaces and nanometric layers
4. Multiple internal reflection infrared spectroscopy using two-prism coupling geometry: A convenient way for quantitative study of organic contamination on silicon wafers
5. Water diffusion into silica glass: Structural changes in silica glass and their effect on water solubility and diffusivity
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