Subject
Fluid Flow and Transfer Processes,Engineering (miscellaneous)
Reference25 articles.
1. Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors;Belaïd;Elsevier Microelectron. Reliab.,2010
2. IC reliabilitv simulation;Chenming;IEEE J. Solid State Circ.,1992
3. LDMOS Devices to Boost Base Station Efficiency;Product news from Philips semiconductors,2003
4. Performance drifts of N-MOSFETs under pulsed RF life test;Belaïd;Elsevier Microelectron. Reliab.,2014
5. An RF stress-based thermal shock test method for a CMOS power amplifier;Zhou;Electron devices Soc.,2021
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