A surface X-ray diffraction study of the Si(111)-Pb-buried interface-Reference-Cited by-同舟云学术

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A surface X-ray diffraction study of the Si(111)-Pb-buried interface

Published:1995-07 Issue: Volume:331-333 Page:646-650
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Howes P.B,Edwards K.A,Hughes D.J,Macdonald J.E,Hibma T,Bootsma T,James M.A

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference15 articles.

1. THE RELATIONSHIP BETWEEN THE METASTABLE AND STABLE PHASES OF Pb/Si (111)

2. Growth and morphology of Pb on Si(111)

3. Quantitative Structural Determination of Metallic Film Growth on a Semiconductor Crystal:(3×3)R30°→(1×1)Pb on Ge(111)

4. Photoemission study of the growth, desorption, Schottky-barrier formation, and atomic structure of Pb on Si(111)

5. Atomic-structure-dependent Schottky barrier at epitaxial Pb/Si(111) interfaces

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interface Induced STM Image at Ultrathin Ag(111) Films on Si(111)√3×√3-B Substrates;Vacuum and Surface Science;2018-10-10

2. X-ray structural analysis of an epitaxially grown Ag film/Si(111)$\sqrt{3} \times \sqrt{3} $-B substrate interface;Japanese Journal of Applied Physics;2018-06-20

3. Height-dependent nucleation and ideal layer by layer growth in Pb/Pb(111)/Si(111);Physical Review B;2008-11-26

4. An extension of the computer program for dynamical calculations of RHEED intensity oscillations. Heterostructures;Computer Physics Communications;2007-01

5. Surface x-ray-diffraction study and quantum well analysis of the growth and atomic-layer structure of ultrathinPb∕Si(111)films;Physical Review B;2005-07-05

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