Measurement of workfunctions by tunnelling and the effect of the image potential
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference18 articles.
1. The electron-electron interaction near an interface
2. Variational Calculation of the Image Potential near a Metal Surface
3. Dynamical corrections to the image potential
4. Image force for a moving charge
5. Harris and Jones image-potential formalism for a quantum particle. Application to surface states
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1. Bias-voltage-dependent measurement of apparent barrier height on low-work-function thin film;Journal of Vacuum Science & Technology B;2020-11
2. Image charge models for accurate construction of the electrostatic self-energy of 3D layered nanostructure devices;Journal of Physics: Condensed Matter;2018-03-05
3. Materials Characterization Using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications;Handbook of Materials Characterization;2018
4. Local tunneling decay length and Kelvin probe force spectroscopy;Physical Review B;2015-12-28
5. Closed-loop conductance scanning tunneling spectroscopy: demonstrating the equivalence to the open-loop alternative;Beilstein Journal of Nanotechnology;2015-05-06
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