Materials Characterization Using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications

Author:

Debata Suryakanti,Das Trupti R.,Madhuri Rashmi,Sharma Prashant K.

Publisher

Springer International Publishing

Reference138 articles.

1. Binning, G., Rohrer, H., Gerber, C., & Weibel, E. (1982). Surface studies by scanning tunneling microscopy. Physical Review Letters, 49, 57.

2. Gasiorowicz, S. (2003). Quantum physics. New York: Wiley.

3. Sun, X. (2010). Engineering supramolecular architectures on insulating and metal surfaces studied by scanning tunneling microscopy. Doctor of Philosophy. Groningen.

4. Tersoff, J., & Hamann, D. R. (1985). Theory of the scanning tunneling microscope. Physical Review B, 31(2), 805.

5. Ekvall, I., Wahlstrom, E., Claesson, D., Olin, H., & Olsson, E. (1999). Preparation and characterization of electrochemically etched W tips for STM. Science and Technology, 10, 11–18.

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