Field ion microscope and atom-probe analysis of Ni overlayers on thin films of Rh2O3
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference19 articles.
1. Atom-Probe Field Ion Microscopy;Tsong,1990
2. Field ion microscopy and pulsed laser atom‐probe mass spectroscopy of insulating glasses
3. The investigation of engineering materials using atom-probe techniques
4. The oxidation of clean ruthenium surfaces. I. Field ion microscope studies
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3. Field ion microscopy of platinum adatoms deposited on a thin Al2O3 film on NiAl(110);Ultramicroscopy;1999-09
4. Structure and diffusion of clusters on Ni surfaces;Surface Science;1992-01
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