The investigation of engineering materials using atom-probe techniques-Reference-Cited by-同舟云学术

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The investigation of engineering materials using atom-probe techniques

Published:1982-01 Issue:3 Volume:8 Page:361-375
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Ralph Brian,Hill S.A.,Southon M.J.,Thomas M.P.,Waugh A.R.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference101 articles.

1. Grain Boundary Structure and Properties;Hondros,1976

2. 4th Bolton Landing Conf. on Grain Boundaries in Engineering Materials;McMahon,1974

3. Introduction to Analytical Electron Microscopy,1979

4. Field-Ion Microscopy, Principles and Applications;Müller,1969

5. The Applications of High Resolution Electron Microscopy in Materials Science,1980

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3. The Role of the Atom Probe in the Study of Nickel-Based Superalloys;Materials Characterization;2000-01

4. The characterization of grain boundaries;Scripta Metallurgica et Materialia;1992-12

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