Effect of nickel on clean silicon surfaces: Transport and structure-Reference-Cited by-同舟云学术

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Effect of nickel on clean silicon surfaces: Transport and structure

Published:1989-08 Issue:1 Volume:218 Page:37-54
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Dolbak A.E.,Olshanetsky B.Z.,Stenin S.I.,Teys S.A.,Gavrilova T.A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference38 articles.

1. Handbook of Auger Electron Spectroscopy;Palmberg,1972

2. An electron diffraction study of the structure of silicon (100)

3. Structural model of Si(100)-c(4×4)

4. Observations of “Clean” Surfaces of Si, Ge, and GaAs by Low-Energy Electron Diffraction

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