Author:
Weiß W.,Starke U.,Heinz K.,Rangelov G.,Fauster Th.,Castro G.R.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference43 articles.
1. Silicides for VLSI Application;Muraka,1983
2. VLSI Microstructure Science;Nicolet,1983
3. X-ray reflectivity and diffuse-scattering study ofCoSi2layers in Si produced by ion-beam synthesis
4. Proc. European Workshop on Refractory Metals and Silicides,1989
Cited by
24 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献