Ellipsometric response to CO adsorption and temperature change for thin silver films

Author:

Merkt U.,Wissmann P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference33 articles.

1. Surface Physics of Phosphors and Semiconductors;Meyer,1975

2. Chemisorption, An Experimental Approach;Wedler,1975

3. Ellipsometry and Polarized Light;Azzam,1977

4. Ellipsometry, low-energy electron diffraction and field electron microscopy combined

5. Ellipsometry—LEED study of the adsorption of oxygen on (011) tungsten

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1. ELLIPSOMETRIC CHARACTERIZATION OF THIN FILMS;Handbook of Surfaces and Interfaces of Materials;2001

2. Structural and optical properties of thin silver films deposited on Si(111);Fresenius' Journal of Analytical Chemistry;1999-09-08

3. Nonlinear optical properties due to the thermal effect in a prism-coupled ZnS thin film;Journal of the Optical Society of America B;1995-10-01

4. States of surface hydrogen under reaction conditions of the Fischer-Tropsch synthesis;Catalysis Letters;1991

5. Phonon assisted absorption in thin Ag films using surface plasmon-polaritons;Journal of Physics: Condensed Matter;1990-08-20

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