Ellipsometry, low-energy electron diffraction and field electron microscopy combined-Reference-Cited by-同舟云学术

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Ellipsometry, low-energy electron diffraction and field electron microscopy combined

Published:1968-01 Issue:3 Volume:9 Page:476-483
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference10 articles.

1. Ellipsometry in the Measurement of Surfaces and Thin Films,1964

2. Ellipsometry in the Measurement of Surfaces and Thin Films;Smith,1964

3. ELECTRON DIFFRACTION IN SURFACE CHEMISTRY

4. Improved Design and Method of Operation of Low Energy Electron Diffraction Equipment

5. Field Emission and Field Ionization;Gomer,1961

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ellipsometric response to CO adsorption and temperature change for thin silver films;Surface Science;1980-06

2. Optically Polarized Conduction-Band Electrons in Tungsten Observed by Spin-Polarized Photoemission;Physical Review Letters;1979-07-02

3. Transition metal compound surfaces;Progress in Surface Science;1979-01

4. Application of ellipsometry to surface films and film growth;Surface Technology;1977-12

5. An AES, leed and work function study of CO2 adsorption on W(100);Surface Science;1976-07

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