Emission energy dependence of ionization probabilities in secondary ion emission from oxygen covered Ta, Nb and Cu surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference33 articles.
1. On mechanisms of sputtered ion emission
2. The sputtering process and sputtered ion emission
3. Experimental and theoretical approaches to the ionization process in secondary-ion emission
4. Thin Film and Depth Profile Analysis,1984
5. Untersuchungen zur Festkörperzerstäubung bei schiefwinkligem Ionenbeschuß polykristalliner Metalloberflächen im Energiebereich um 1 keV
Cited by 48 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. New Compound and Hybrid Binding Energy Sputter Model for Modeling Purposes in Agreement with Experimental Data;The Planetary Science Journal;2023-05-01
2. Properties of secondary ions in ion beam sputtering of Ga2O3;Journal of Vacuum Science & Technology A;2021-09
3. Energy distributions of secondary ions for the Ar ion beam sputtering of indium tin oxide;Journal of Vacuum Science & Technology B;2020-11
4. Ionization probability of sputtered coronene molecules;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-12
5. Emission of velocity-correlated clusters in fullerene-solid single collision and diagnostics of the impact energized subsurface nanovolume;The Journal of Chemical Physics;2019-05-28
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3