Calculation of surface peak intensity in MeV ion scattering. II
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference24 articles.
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Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Reactivity and stability of various metal-silicon interfaces studied by high energy ion scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-12
2. Non-destructive and quantitative analysis of buried interfaces of Si-related crystalline multilayers using high-energy ion scattering;Applied Surface Science;1992-01
3. Ion Beam Studies of Crystal and Interface Atomic Structure;Nuclear Physics Applications on Materials Science;1988
4. Metal/Silicon Reactions Studied by High Energy Jon Scattering;Japanese Journal of Applied Physics;1987-06-20
5. Multiple Scattering Correction to the Channeling Surface Peak for Thin Overlayers;Japanese Journal of Applied Physics;1986-06-20
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